The Integrated Cryogenic Electronics Test-bed (ICE-T) is designed for rapid and convenient testing of low-temperature electronics, especially for superconductor electronics, integrated circuits and multi-chip modules. It is completely cryogen-free and can be configured to test a wide variety of devices and ICs.
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ICE-T can be reconfigured through user-specified electrical inserts, ranging from standard to fully customized. Completely cryogen free, ICE-T runs on a 3-phase power supply. The modular and versatile design allows inserts to function as liquid helium immersion cryoprobes, without the associated high cost of liquid helium.
Other applications suitable for ICE-T include high-speed superconducting electronic chips for supercomputing applications, process-control monitors and digital diagnostics, high-performance cryogenic analog-to-digital converters for RF receivers, analog low-noise measurements for SQUIDs and SQIFs, and cryogenic semiconductor devices.
Find a few of our publications about ICE-T system here:
- Superconductor Integrated Circuit (IC) Testing with the Integrated Cryogenic Electronics Testbed (ICE-T)
https://doi.org/10.1109/TASC.2017.2654342 - Integrated Cryogenic Electronics Testbed (ICE-T) for Evaluation of Superconductor and Cryo-Semiconductor Integrated Circuits
https://doi.org/10.1088/1757-899X/171/1/012145 - High throughput and variable temperature superconductor integrated circuit test and evaluation using ICE-T
https://doi.org/10.1088/1757-899X/756/1/012012